Characterization of imaging detectors based on photoluminescence of radiation-induced defects in lithium fluoride for X-FEL beam monitoring.

Bonfigli F., Capotondi F., Cricenti A., Giannessi L., Kiskinova M., Luce M., Mahne N., Manfredda M., Montereali R.M., Nichelatti E., Pedersoli E., Raimondi L., Vincenti M.A., Zangrando M.

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We report the use of imaging detectors based on photoluminescence of radiation-induced color centers ($F^{2}$ and $F_{3}^{+}$) in lithium fluoride (LiF) films for the detection of ultra-short, ultra-high pulses provided by the FERMI-FEL. LiF films were irradiated by FEL pulses ($\lambda= 32$ nm and $\lambda= 20$ nm) of different fluences and the stored images were observed by optical microscopes in far and near-field conditions. The obtained results are encouraging for the use of LiF-films as imaging detectors for monitoring FEL spatial intensity distribution. The peculiarities of LiF-based detectors could also be exploited for coherent diffraction imaging experiments.

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